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Fully automatic/semi-automatic probe station for performance testing of 6" and 8" wafer-level devices,Can be tested against different wafers,Can be equipped with appropriate instruments,The characteristics of I-V, C-V and optical signals are analyzed,Equipment features,Can match a variety of test application environments,Can upgrade high-power wafer testing, RF testing, fully automatic testing and can load temperature control system,To meet customer requirements for various wafer device performance testing in high and low temperature environments。
Automatic probe station series
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Fully automatic/semi-automatic probe station for performance testing of 6" and 8" wafer-level devices,Can be tested against different wafers,Can be equipped with appropriate instruments,The characteristics of I-V, C-V and optical signals are analyzed,Equipment features,Can match a variety of test application environments,Can upgrade high-power wafer testing, RF testing, fully automatic testing and can load temperature control system,To meet customer requirements for various wafer device performance testing in high and low temperature environments。
Semi-automatic probe station series